Test of Prototype Double Sided Silicon Detectors for Exl Project at Gsi Darmstadt, Germany

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XUAN CHUNG LE1,2, PETER EGELHOF2, MANFRED MUTTERER2, MIRKO VON SCHMID2 AND BRANISLAV STREICHER2

1Institute for Nuclear Science and Technology

2Gesellschaft für Schwerionenforschung (GSI)

Abstract: Prototype double-sided silicon strip detectors (DSSD) of 300 μm thickness produced at PTI St. Petersburg (Russia) were tested for the use as position sensitive, ∆E and E detectors for tracking and particle identification in the EXL (EXotic nuclei studied in Light-ion induced reactions) setup at the FAIR (Facility for Antiproton and Ion Research) project at GSI. We describe the characteristics of detectors with 16×16 strips of 300 μm pitch size and 7.1×7.1 mm2 chip dimension, and also with 64×64 and 64×16 strips of 300 μm and 1250 μm pitch size, respectively, and 21.2×21.2 mm2 chip dimension. The response of these detectors for 241Am α particles injected either from the p or n side was examined. The test measurements were performed partially at GSI and the University of Edinburgh. The results reveal good spectroscopic properties of these detectors. Our work will continue with 100 μm thick detectors and larger active area, up to 65×65 mm2.
Keywords: Double-sided Silicon Strip Detectors (DSSD)

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